describe how we use V protocol aware solution to test a complex RF device. form reconstruction utilizes the coherency of V SOC system to. Download scientific diagram | Agilent SOC Series tester. from publication: Test engineering education in Europe: the EuNICE-Test project | The paper. Download scientific diagram | Agilent SOC Series Digital IC Test System from publication: Process Models for the Reconstruction of Software Architecture .

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Reconfiguration is done instantly when the test program is loaded, 9000 no downtime. The Pin Scale features a Test Processor-Per-Pin architecture, which allows all processing to occur locally in the card, and in parallel across pins, providing maximum parallel efficiency.

The Pin Scale protects your investment through expanded scalability, which provides the performance needed to test a wide variety of devices now and into the future. Available per-pin licenses for memory depth: Provides performance headroom for the future, protecting your investment.

Because the reconfiguration is accomplished via software, no hardware is moved, which eliminates the need to recalibrate and eliminates the risk of hardware damage during movement. Optional waveforms Provides greater timing flexibility for ease of programming.

Product Summary Per-pin scalability up to Mbps High 930000 digital card with per-pin scalability up to Mbps offers the lowest cost SOC test in production. An uncertain future demands the ability to upgrade quickly to meet the next performance challenge while continuing to reduce agilwnt.

Per-pin agilfnt licenses for speed and memory depth mean you add just the performance you need, when you need it. Each pin of the Pin Scale can be scaled over its wide memory depth and speed range through per-pin software licenses, which provides the lowest cost of test by allowing the test system to be configured to match device requirements, pin-by-pin. Unified memory approach The unified memory approach pools memory for both sequence instructions and vectors.


Agilent Pin Scale Product Overview Industry Challenges Consumer demand for more capability and connectivity in a single product is driving the need for more functionality, faster processing and higher speed interfaces in next-generation System-on-a-Chip SOC and System-in-Package SIP devices. Each pin operates independently, enabling parallel processing for maximum multi-site efficiency.

Agilent P for sale / JMC Worldwide Inc.

With 32 pins on the Pin Scale digital card, an Agilent can be configured with up to pins, providing the pin count needed for multi-site test of even high pin count devices. With per-pin licenses to enable the different speed and memory performance levels — part of the 9300 Agilent InstaPin performance library — the Pin Scale digital card can be configured to match the device requirements, pin-by-pin, resulting in the lowest cost of test.

Testing in higher x-modes means that more logical vector memory is available. Documents Flashcards Grammar checker. Up to pins Support of multi-site for high pin count devices reduces cost-of-test.

Agilent InstaPin also maximizes asset utilization because the per-pin licenses for speed and memory depth of Pin Scale digital cards can float between pins on a card, cards in a tester and testers on a test floor agklent different production facilities around the world. Flexible waveform generation for high-speed applications.

Also beneficial to generate low jitter high-speed clock signals. This flexibility can be especially important for embedded memory, microprocessor and protocol-based communications applications. As test needs change to agileht a new class of device or next-generation performance, the Pin Scale can be instantly reconfigured through software to maximize the lifetime of your investment.


Provides performance for high speed interface test, such as DDR, operating over Mbps. The value of parallel test, however, depends on its efficiency. This unmatched performance also enables testing of logic cores in a range of applications while maintaining headroom for increasing processing speeds.

Agilent 93000 Pin Scale 800

This lowers immediate capital investment and provides for agient growth as devices evolve from generation to generation, integrating more high-speed interfaces or achieving higher processing speeds.

The entire amount of purchased memory is available for both test vectors and sequencer instructions, which provides more flexibility than architectures based upon two unshared memory areas. And this agikent all be done at a lower costof-test than last year because of ongoing price erosion. This enables the Agilent to offer the following pin counts: Per-pin scalability from to Mbps The test system can be configured to match device requirements, pin-by-pin, for lowest cost.

Compatible with Agilent Ce-channels Protects your investment in equipment, people and training Additional Detail Up ahilent pins The Pin Scale offers 32 pins per card, which is twice the density of the Ce- and P-model digital cards. To test these devices, a test system must have the capability to address a range of performance challenges: For printed directions on Preparing for Registration.